The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2013

Filed:

Nov. 18, 2008
Applicant:

Kumiko Matsui, Yokohama, JP;

Inventor:

Kumiko Matsui, Yokohama, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A modulation contrast microscope that affords good view of sperm in ICSI, in particular, good view during sperm manipulation in ICSI, by improving contrast of the end portion of the tail includes the modulation contrast microscope comprises an aperture member having a partial aperture disposed at or near the front focal plane of a condenser lens, and a modulator disposed at a plane substantially conjugate with the aperture member, at or near the rear focal plane of a first objective lens or a conjugate plane thereof. The transmittance T(%) of a region of the modulator, corresponding to the partial aperture, satisfies the condition 1 £ T £ 8. Good viewing for ICSI sperm manipulation can be obtained as a result.


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Matsui, Kumiko. (2013). Modulation contrast microscope (U.S. Patent No. 8599479). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8599479

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