The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2013

Filed:

Nov. 17, 2010
Applicant:

Roger Schmidt, Shorewood, MN (US);

Inventor:

Roger Schmidt, Shorewood, MN (US);

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods for comparing infrared image data and/or for generating infrared image comparison data are provided. In one method two image data sets are selected including visual-light and infrared image data from one or more points of view of a scene. Visual-light image data from each data set can be compared to determine an alignment correlation between different points of view for the visual-light data. The alignment correlation can then be used to correlate infrared image data from each data set. The correlated infrared image data can be compared to generate infrared comparison image data. Thermal imaging cameras capable of performing such methods are also provided.


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