The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2013

Filed:

Oct. 18, 2011
Applicants:

Hartman Van Wyk, Mont Louis sur Loire, FR;

Youcef Haddab, Paris, FR;

Jean-jacques Dormard, Paris, FR;

Inventors:

Hartman Van Wyk, Mont Louis sur Loire, FR;

Youcef Haddab, Paris, FR;

Jean-Jacques Dormard, Paris, FR;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Current flow at a line frequency may be measured from a source using matched voltage drops in a pair of voltage drop circuits. The voltage drop circuits may each includes a fixed value component, such as a resistor, and an adjustable value component, such as an adjustable current source, coupled in series. The adjustable valued components may be controlled based on differences in voltage drops produced by the voltage drop circuits based on a high-frequency signal, higher in frequency than the line frequency, applied to a control input for each of the adjustable value components.


Find Patent Forward Citations

Van Wyk, Hartman. (2013). Instrumentation circuit for shunt-based metrology measurement (U.S. Patent No. 8598885). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8598885

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…