The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2013
Filed:
Jun. 09, 2010
Applicants:
Qianmei Zhang, Katy, TX (US);
Constantyn Chalitsios, Houston, TX (US);
Inventors:
Qianmei Zhang, Katy, TX (US);
Constantyn Chalitsios, Houston, TX (US);
Assignee:
Baker Hughes Incorporated, Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 5/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
A downhole instrument for estimating density of sub-surface materials includes: a neutron source, a source monitoring detector, a near detector and a far detector. Each of the detectors may be coupled to an electronics unit adapted for receiving a detection signal from each of the detectors and compensating the detection signal for at least one of the near detector and the far detector according to the detection signal of the source monitoring detector. A method for estimating density is provided.