The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2013
Filed:
Mar. 28, 2011
Michael P. Easton, Tucson, AZ (US);
Casey T. Streuber, Tucson, AZ (US);
Page Elizabeth King, Tucson, AZ (US);
Michael P. Easton, Tucson, AZ (US);
Casey T. Streuber, Tucson, AZ (US);
Page Elizabeth King, Tucson, AZ (US);
Raytheon Company, Waltham, MA (US);
Abstract
A motionless focus evaluation test station is provided for measuring detector position error of EO sensors that do not possess dynamic focus capability. A positionally-fixed source emits EM radiation that diverges along an optical axis of the test station. Collimating optics collimate the EM radiation and direct it along the optical axis to the EO sensor. A positionally-fixed target is placed in the path of the diverging EM radiation nominally at the focal plane of the collimating optics. The target comprises a limiting aperture that exhibits an induced shift in optical focus at different positions along the aperture such that different positions on the target are imaged to different focal planes at the detector. The detector captures an image of the target that is blurred to either side of the spatial position that is optically conjugate to the actual detector position. A processor processes the image to measure the blur as function of spatial position to measure the actual detector position and output detector position error from a desired detector position.