The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8597885 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 03, 2013

Filed:

Jan. 28, 2010
Applicant:

Steven Buechler, Granger, IN (US);

Inventor:

Steven Buechler, Granger, IN (US);

Assignee:

University of Notre Dame, Notre Dame, IN (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12Q 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An Accelerated Progression Relapse Test (APRT) is provided for use in the prognosis of a diseased state in a patient. The APRT provides a determination of when a patient in a particular diseased state is likely to benefit from further disease treatment, or does not have a high probability of benefit with additional treatment. In particular applications, the APRT may be used to determine the prognosis of an estrogen receptor positive (ER+) breast cancer patient. Four genetic probes are disclosed for this test, and target MK167, CDC6 and SPAG5 gene products. The ER+ breast cancer patient/patient population is stratified into two groups, with the low gene expression group identifying the patient/patient group that is less likely to benefit from additional treatment measures, and a high gene expression group identifying the patient/patient group as more likely to benefit from additional treatment measures.


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