The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2013
Filed:
Jan. 12, 2006
Guangming Dai, Fremont, CA (US);
Kingman Yee, San Jose, CA (US);
Dimitri Chernyak, Santa Clara, CA (US);
Guangming Dai, Fremont, CA (US);
Kingman Yee, San Jose, CA (US);
Dimitri Chernyak, Santa Clara, CA (US);
AMO Manufacturing USA, LLC, Santa Ana, CA (US);
Abstract
Computer systems, programs, and methods can advantageously be used to process optical data. These approaches often involve modifying a first format data to a second format data, and are useful in simplifying the complications due to data from different wavefront systems, different aberrometer devices and aberrometer software versions, different clinical studies and different measurement conditions. A centralized database system can be used effectively in a clinical research setting, which can be a medical center, a college, or a research department in a company, or in other diagnosis or treatment facilities.