The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2013

Filed:

Oct. 14, 2011
Applicant:

Yukito Hirayama, Aichi, JP;

Inventor:

Yukito Hirayama, Aichi, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/02 (2006.01); A61B 3/032 (2006.01);
U.S. Cl.
CPC ...
A61B 3/032 (2013.01);
Abstract

An optotype presenting apparatus for presenting an optotype used to test a visual function of an examinee includes: an optotype presentation part configured to present the optotype in a predetermined presentation region; a control unit configured to allow a test optotype to be presented in the optotype presentation part, the test optotype including a stereoscopic vision test optotype that generates a parallax so as to be seen by the examinee as floating or sinking from a predetermined reference plane; and an optotype splitting unit configured to split the test optotype presented in the optotype presentation part into an optotype for a left eye and an optotype for a right eye to present the test optotype to right and left eyes of the examinee, wherein the test optotype includes a guide optotype for guiding the examinee to see the stereoscopic vision test optotype stereoscopically.


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