The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2013
Filed:
Jun. 12, 2007
Baruch Karp, Beer Sheva, IL;
Daniel Rittel, Haifa, IL;
David Durban, Haifa, IL;
Technion Research and Dvelopment Foundation Ltd., Haifa, IL;
Abstract
The present invention provides a system and a method monitoring the health of structural joints by monitoring the strain developed near the joint due to perturbation applied away from that joint and comparing the monitored ratio between near field and far field strain to strain ratio which develops in a healthy joint due to comparable perturbation. The system for monitoring joints comprises: at least one near field strain measuring device installed near a monitored joint for monitoring the induced strain; at least one far field strain measuring device installed away from monitored joint indicating, measuring or producing the perturbation; and a data processor connected to said near field strain measuring device and to said near field strain measuring device for analyzing the response of the structure to the perturbation and determining the integrity of said joint.