The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2013

Filed:

Jan. 25, 2011
Applicant:

Russell M. Kurtz, Palos Verdes Estates, CA (US);

Inventor:

Russell M. Kurtz, Palos Verdes Estates, CA (US);

Assignee:

RAN Science & Technology, LLC, Rolling Hills Estates, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A nondestructive evaluation system, consisting of a metrology device and a directable acoustic transducer, is used to measure the variation of the surface when stress is applied. The directable acoustic transducer selects the location of the applied stress. The difference between the surface during stress application and in the absence of stress detects both surface and buried defects along the location of the stress. By scanning the beam from the acoustic transducer, the location of the stress can be adjusted, enabling the system to locate the detected defect in three dimensions.


Find Patent Forward Citations

Loading…