The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2013
Filed:
May. 28, 2009
Stephan Falter, Simmerath, DE;
Roman Koch, Blankenbach, DE;
Walter DE Odorico, Kelkheim, DE;
Gerhard Finger, Limeshain, DE;
Klaus-peter Busch, Rodenbach, DE;
Stephan Falter, Simmerath, DE;
Roman Koch, Blankenbach, DE;
Walter De Odorico, Kelkheim, DE;
Gerhard Finger, Limeshain, DE;
Klaus-Peter Busch, Rodenbach, DE;
GE Inspection Technologies, Huerth, DE;
Abstract
The invention relates to a method for processing signals which are generated by the reflection of ultrasonic waves by defects in the surface of objects during the non-destructive testing of objects such as pipes, bars, sheet metal, or uniform and complex carbon-fiber components. Said method comprises the following steps: emission of a complete wavefront onto at least one test section of the object, using a plurality of independent emission elements; receiving a wave reflected by the structure of the object by means of a plurality of receiver elements that are independent of one another; digitalization of the signals received by the receiver elements in digitizing steps; continuous modification of delay values and/or the number of receiver elements for each digitalization step (on-the-fly).