The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8595861 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 26, 2013

Filed:

May. 18, 2012
Applicants:

Bernard Haochih Liu, Tainan, TW;

Fang-yi Liao, Taichung, TW;

Jian-hong Chen, Nantou County, TW;

Inventors:

Bernard HaoChih Liu, Tainan, TW;

Fang-Yi Liao, Taichung, TW;

Jian-Hong Chen, Nantou County, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01Q 60/58 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/58 (2013.01); Y10S 977/867 (2013.01);
Abstract

A thermal probe includes a support element, a conductive pattern and a tip. The conductive pattern is disposed at the support element and has plural bending portions. The tip has a base and a pinpoint. The base has a first surface and a second surface which is opposite to the first surface. The pinpoint is disposed at the first surface. The second surface is connected with the conductive pattern. The bending portions are contacted with the first surface. The tip of the thermal probe is replaceable, and the user can choose the optimum combination of the tip, conductive pattern and support element according to their needs.


Find Patent Forward Citations

Liu, Bernard. (2013). Thermal probe (U.S. Patent No. 8595861). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8595861

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