The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2013

Filed:

Jun. 19, 2011
Applicants:

Rachel Tzoref-brill, Haifa, IL;

Itai Segall, Tel-Aviv, IL;

Tatyana Veksler, Zichron Yaakov, IL;

Inventors:

Rachel Tzoref-Brill, Haifa, IL;

Itai Segall, Tel-Aviv, IL;

Tatyana Veksler, Zichron Yaakov, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer-implemented method, apparatus, and computer program product for assisting in dynamic verification of a System Under Test (SUT). The method comprising obtaining a set of functional attributes and associated domains with respect to a System Under Test (SUT), and obtaining a set of restrictions over the functional attributes and associated domains. The method comprising encoding a Binary Decision Diagram (BDD) to represent a Cartesian cross-product test-space of all possible combinations of values of the functional attributes excluding combinations that are restricted by the set of restrictions, whereby the BDD symbolically represents the Cartesian cross-product test-space. The method may further comprise analyzing the Cartesian cross-product test-space by manipulating the BDD so as to assist in performing dynamic verification of the SUT.


Find Patent Forward Citations

Loading…