The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
Oct. 27, 2010
Ting LU, Austin, TX (US);
Robert L. Pelt, San Jose, CA (US);
Bradley L. Taylor, Santa Cruz, CA (US);
Ting Lu, Austin, TX (US);
Robert L. Pelt, San Jose, CA (US);
Bradley L. Taylor, Santa Cruz, CA (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
A method of debugging within an integrated circuit (IC) that includes an embedded processor can include detecting an event within a circuit of the IC that is external to the processor and, responsive to detecting the event, initiating a debug function within the processor. Similarly, responsive to detecting an event within the processor, a debug function within a circuit block of the IC that is external to the processor can be initiated. Trace data generated within the processor and trace data generated within the programmable fabric further can be merged to generate combined trace data.