The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
Jan. 13, 2011
Applicant:
Bradley L. Taylor, Santa Cruz, CA (US);
Inventor:
Bradley L. Taylor, Santa Cruz, CA (US);
Assignee:
Xilinx, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of debugging an integrated circuit (IC) can include receiving, within a debugging system implemented within the IC, a debug command from a system external to the IC and, responsive to the debug command, initiating a debug function specified by the debug command for a processor system embedded on the IC. An IC also is provided that can include a programmable circuitry (e.g., a programmable fabric) coupled via an interface to processor system embedded in the IC. A debugging system can be implemented within the programmable fabric to communicate with the processor system via the interface.