The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2013

Filed:

Mar. 08, 2011
Applicants:

Kenric P. Nelson, Hollis, NH (US);

Brian J. Scannell, Cambridge, MA (US);

Herbert Landau, Alexandria, VA (US);

Inventors:

Kenric P. Nelson, Hollis, NH (US);

Brian J. Scannell, Cambridge, MA (US);

Herbert Landau, Alexandria, VA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

The technology described herein includes a system and/or a method of risk management for object identification. The method includes selecting at least two fusion functions from a plurality of fusion functions. Each of the fusion functions is associated with a different risk bias. The method further includes fusing a received set of data based on each fusion function to form at least two sets of fused data. The method further includes generating a probability of identification of the classification of the object based on each set of the fused data. The method further includes determining a risk bias difference between the probability of identification of each set of the fused data.


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