The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2013

Filed:

Jun. 09, 2010
Applicants:

Steven Mark Drucker, Bellevue, WA (US);

Kayur Dushyant Patel, Seattle, WA (US);

Desney S. Tan, Kirkland, WA (US);

Ashish Kapoor, Kirkland, WA (US);

James Anthony Fogarty, Seattle, WA (US);

Inventors:

Steven Mark Drucker, Bellevue, WA (US);

Kayur Dushyant Patel, Seattle, WA (US);

Desney S. Tan, Kirkland, WA (US);

Ashish Kapoor, Kirkland, WA (US);

James Anthony Fogarty, Seattle, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multiple model data exploration system and method for running multiple machine-learning models simultaneously to understand and explore data. Embodiments of the system and method allow a user to gain a greater understanding of the data and to gain new insights into their data. Embodiments of the system and method also allow a user to interactively explore the problem and to navigate different views of data. Many different classifier training and evaluation experiments are run simultaneously and results are obtained. The results are aggregated and visualized across each of the experiments to determine and understand how each example is classified for each different classifier. These results then are summarized in a variety of ways to allow users to obtain a greater understanding of the data both in terms of the individual examples themselves and features associated with the data.


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