The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
Jun. 27, 2010
Hsien-chuan Liang, Taipei Hsien, TW;
Shen-chun LI, Taipei Hsien, TW;
Shou-kuo Hsu, Taipei Hsien, TW;
Hsien-Chuan Liang, Taipei Hsien, TW;
Shen-Chun Li, Taipei Hsien, TW;
Shou-Kuo Hsu, Taipei Hsien, TW;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Abstract
A system and method for testing objects using a mechanical arm sets one or more first positions. When a user selects one or more second positions of the mechanical arm, a distance between each of the second positions and each of the first positions is calculated. A nearest first position of each of the second positions is determined. Each of the second positions is stored in a test list corresponding to each of the nearest first positions. The mechanical arm is controlled to move to each of the nearest first positions, and tests objects located at the second positions stored in each test list corresponding to each of the nearest first positions.