The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
May. 26, 2011
Julian Bartholomeyczik, Reutlingen, DE;
Sergej Scheiermann, Eningen, DE;
Julian Bartholomeyczik, Reutlingen, DE;
Sergej Scheiermann, Eningen, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
In a method for determining an offset of measured values of a multiaxial directional sensor using a superposed signal, a large number of multiaxial measured values are recorded first. Measured values, which are recorded in different orientations of the directional sensor, form a geometric figure in a coordinate system resulting from the measuring axes of the sensor, the ideal form of the geometric figure being known and the ideal center point of which being located at the origin of the measuring axes. In the case of a biaxial sensor, the geometric figure is a circle; in the case of a triaxial sensor, it is a sphere around the origin. The superposition caused by the interference is reflected in that the center point of the geometric figure is shifted in relation to the origin of the measuring axes. The offset is measured by determining this shift.