The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
Aug. 09, 2010
Rainer Wiesenfarth, Stuttgart, DE;
Rainer Wiesenfarth, Stuttgart, DE;
INPHO GmbH, Stuttgart, DE;
Abstract
The invention relates to a method for selecting a seam between two overlapping images of an area of interest. It includes generating a difference value associated with each portion of the overlapping region, wherein the difference value associated with a portion is derived from the difference between at least one property of the portion in the two images It also includes selecting, through the overlapping region, a path between two points located at the edge of the overlapping region based on the sum of the difference values of the portions along the path. The path is set as the seam. The seam may be used for combining the overlapping images into one image. The invention also relates to a unit, an apparatus, a computer program and an image.