The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2013

Filed:

Jun. 03, 2010
Applicants:

Yoshiko Yoshihara, Tokyo, JP;

Kenji Okajima, Tokyo, JP;

Akira Saito, Tokyo, JP;

Inventors:

Yoshiko Yoshihara, Tokyo, JP;

Kenji Okajima, Tokyo, JP;

Akira Saito, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention is directed to improvement of the accuracy of cancer differentiation in the pathologic diagnosis using a pathologic tissue image analysis. There are included a stroma area/duct area detecting module for detecting, from a biological tissue image, a duct area on the basis of duct characteristic information indicating the characteristic of ducts included in a tissue area in the biological tissue image; an intraduct cell-nucleus detecting module for extracting, based on a predetermined pigment reference, cell nucleuses included in the detected duct area; and a duct formation evaluating module for calculating a heterotypic degree of each duct on the basis of the distribution state of the cell nucleuses for a predetermined base areas in each duct.


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