The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2013

Filed:

Nov. 30, 2007
Applicants:

Ayelet Pnueli, Haifa, IL;

Renato Keshet, Haifa, IL;

Avi Schori, Kochav Yair, IL;

Yaron Ruckenstein, Haifa, IL;

Inventors:

Ayelet Pnueli, Haifa, IL;

Renato Keshet, Haifa, IL;

Avi Schori, Kochav Yair, IL;

Gitit Ruckenstein, Haifa, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method embodiments of the present invention provide for semi-automated or fully automated assessment of the quality of device-rendered text, including graphical symbols, characters, and other printable or displayable patterns. Method embodiments of the present invention employ one or more metrics that involve the comparison of input characters, including text characters, symbols, and character-like graphics, with corresponding digital output characters obtained by capturing images of characters rendered by a character-rendering device. The one or more metrics include individual computed relative entropy APQi metrics, reflective of differences in character-to-character distance distributions between one input character c, and the set of input characters c*, a cumulative computed relative entropy APQ, stroke irregularity, contrast measure, sharpness, and background uniformity. These individual metrics can be computed and stored separately as well as output to a user of a character-rendering-quality measurement system, or may be combined together in various ways to produce one or more comprehensive, cumulative metrics for storage and output.


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