The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2013

Filed:

May. 27, 2009
Applicants:

Hila Nachlieli, Haifa, IL;

Doron Shaked, Tivon, IL;

Shai Druckman, Rehovot, IL;

Maya Shalev, Tel Aviv, IL;

Yaniv Yona, Rehovot, IL;

Inventors:

Hila Nachlieli, Haifa, IL;

Doron Shaked, Tivon, IL;

Shai Druckman, Rehovot, IL;

Maya Shalev, Tel Aviv, IL;

Yaniv Yona, Rehovot, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, diagnostic tool and system are provided for evaluating printing defects. A captured image of a printed sheet is received and a profile generated of the printed sheet, this profile being representative of tonal variations in the printed sheet. The profile is analyzed in a plurality of different scales and an assessment made of the significance of one or more features of a printing defect throughout the plurality of different scales. From the assessed significance of the one or more features, an evaluation is carried out, in each of the plurality of different scales, of the severity of the printing defect.


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