The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
Dec. 19, 2012
Xueshi Yang, Cupertino, CA (US);
Yu-yao Chang, Sunnyvale, CA (US);
Michael Madden, Mountain View, CA (US);
Zining Wu, Los Altos, CA (US);
Xueshi Yang, Cupertino, CA (US);
Yu-Yao Chang, Sunnyvale, CA (US);
Michael Madden, Mountain View, CA (US);
Zining Wu, Los Altos, CA (US);
Marvell International Ltd., Hamilton, BM;
Abstract
An apparatus includes: a signal module to process data signals corresponding to data on a storage medium to generate signal samples; a defect detector to receive the signal samples, apply a set of parameters to the signal samples, and generate an output based on a count of signal samples that are associated with abnormal signal quality, the signal samples that are associated with abnormal signal quality being included in a portion of the signal samples determined in accordance with the set of parameters; and circuitry to receive the output from the defect detector and identify one or more media defects based on the output.