The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
Mar. 14, 2013
Faro Technologies, Inc., Lake Mary, FL (US);
Peter G. Cramer, Coatesville, PA (US);
Robert E. Bridges, Kennett Square, PA (US);
Nils P. Steffensen, Kennett Square, PA (US);
Robert C. Mehler, Coatesville, PA (US);
Kenneth Steffey, Longwood, FL (US);
John M. Hoffer, Jr., Bel Air, MD (US);
Daniel G. Lasley, West Chester, PA (US);
Faro Technologies, Inc., Lake Mary, FL (US);
Abstract
A method is provided of obtaining the characteristics of a target by a device. The method includes providing the target having a target frame of reference, a retroreflector and a body. Providing a contact element rigidly fixed with respect to the body. A device is provided having a frame of reference and a light source, the device configured to measure a distance and two angles from the device to the retroreflector reference point. An identifier element located on the body. A workpiece surface is provided. The contact element contacts the workpiece surface. The retroreflector is illuminated with light from the light source and returns a reflected light. A distance and two angles are measured based at least in part on the reflected light. The first information is read with a first reader attached to the device. A three-dimensional coordinate of a point on the workpiece surface is calculated.