The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
Apr. 11, 2012
William J. Crann, Jr., Bad Axe, MI (US);
William J. Crann, Jr., Bad Axe, MI (US);
Millennium Industries Corporation, Ligonier, IN (US);
Abstract
A method for inspecting the inner surface of a tubular structure for contamination comprises emitting a light beam directed onto the inner surface at a first end thereof, wherein the beam is directed at a predetermined glancing angle such that it repeatedly reflects off of the inner surface of the tubular structure along the length thereof. The method further comprises receiving the reflected beam at a second end of the tubular structure. The method still further comprises measuring a value of the reflectance of the received reflected beam, defining a parameter value using the measured value, and comparing the parameter value with a predetermined threshold value. The method further comprises determining, based on the comparison, the extent to which the inner surface of the tubular structure is contaminated, and displaying an indication representative of the contamination based on the determination. An apparatus for performing the method is also provided.