The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
Jan. 16, 2009
Xavier Levecq, Gif sur Yvette, FR;
Guillaume Dovillaire, Palaiseau, FR;
Xavier Levecq, Gif sur Yvette, FR;
Guillaume Dovillaire, Palaiseau, FR;
Imagine Optic, Orsay, FR;
Abstract
An instrument () for characterizing an optical system, includes: at least one primary source () for emitting an illumination light beam (FE); an optical device for directing the illumination beam (FE) onto the optical system (L) to be characterized; a wave front analyzer () adapted for receiving a beam from the optical system (L); and a unit for processing the measure signals from the wave front analyzer (), adapted for providing characterization information of the optical system (L). The instrument further includes a scattering member () substantially provided in the focal plane of the optical system (L) so as to create a secondary source generating a secondary beam flowing through the optical system (L) and further directed towards the wave front analyzer.