The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
Jul. 29, 2011
William C. Ross, Littleton, CO (US);
Richard J. Langenwalter, Lakewood, CO (US);
William C. Ross, Littleton, CO (US);
Richard J. Langenwalter, Lakewood, CO (US);
Landmark Graphics Corporation, Houston, TX (US);
Abstract
Correlating a measured and predicted log. At least some illustrative embodiments are methods including: plotting values of the measured log with respect to an ordinate axis and an abscissa axis, and the plotting in a first pane; plotting values of the predicted log with respect to the ordinate axis and the abscissa axis; selecting an inflection point of the predicted log; shifting horizontal position of the inflection point relative to the measured log responsive to the pointing device; changing dip of at least one modeled surface in a structural model based the relative location of the inflection point; recalculating the predicted log based on the change in dip, the recalculating creates a modified predicted log; and then plotting the modified predicted log. In some cases, the method may also include adding a fixed X, Y, Z point in the at least one modeled surface based on location of the inflection point.