The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2013

Filed:

Dec. 10, 2010
Applicants:

Koichi Kusukame, Osaka, JP;

Shinichi Kadowaki, Fukuoka, JP;

Hiroyuki Furuya, Fukuoka, JP;

Inventors:

Koichi Kusukame, Osaka, JP;

Shinichi Kadowaki, Fukuoka, JP;

Hiroyuki Furuya, Fukuoka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An component concentration meter includes an output unit that outputs an electromagnetic wave to an object to be measured and includes a detecting unit that detects the property of the electromagnetic wave passed through the object to be measured under a first condition and under a second condition in which the temperature of the object to be measured is different from that under the first condition. The component concentration meter also includes a concentration determining unit that determines the concentration of a target component contained in the object to be measured, based on a property difference which is a difference between the properties of the electromagnetic wave detected by the detecting unit under the first condition and under the second condition and a difference between the temperatures of the object to be measured under the first condition and under the second condition.


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