The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2013

Filed:

Jun. 06, 2011
Applicants:

John M. Nilles, Elkridge, MD (US);

Theresa R. Connell, Bel Air, MD (US);

H. Dupont Durst, Bel Air, MD (US);

Inventors:

John M. Nilles, Elkridge, MD (US);

Theresa R. Connell, Bel Air, MD (US);

H. Dupont Durst, Bel Air, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A vapor sampling adapter for direct analysis in real time mass spectrometer (DART-MS) applications comprises a vapor transport line and a manifold. In the preferred embodiment the vapor transport line is heated and approximately 20 feet in length. This provides a means to utilize the highly accurate and reliable DART-MS device to detect chemical agents at sample location points up to 20 feet away from the device with the ability to easily move the sampling point to any desired point within the sampling range, thus allowing the operator to systematically scan a site in a fashion similar to that used with a handheld detector. Sample vapor flows through the vapor transport line to the manifold where it comes in proximity to the ion generator of the DART mass spectrometer before entering into the mass spectrometer for analysis. The present invention may be used to raster a surface to determine the precise location of chemical agent contamination. Additionally, the invention may be used to tune or calibrate a DART-MS.


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