The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2013

Filed:

Feb. 27, 2012
Applicants:

Naomi Kitamura, Yokohama, JP;

Yuji Masuda, Yokohama, JP;

Hiroyuki Ohnishi, Tokyo, JP;

Inventors:

Naomi Kitamura, Yokohama, JP;

Yuji Masuda, Yokohama, JP;

Hiroyuki Ohnishi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A skin state analyzing method for analyzing the skin state of an examinee using an image of the skin of the examinee includes an analyzing step of analyzing at least one of texture/pores, spots, skin tone, and sebum of the skin from the image, a storing step of storing the image and an analysis result obtained from the analyzing step in association with skin examination date/time information and examinee information, a display screen generating step of generating a screen displaying the image and the analysis result of the examinee stored in the storing step, and an output step of outputting the information generated in the display screen generating step.


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