The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
Jul. 20, 2011
Zuomin Liao, Shenzhen, CN;
Minghung Shih, Shenzhen, CN;
Zuomin Liao, Shenzhen, CN;
Minghung Shih, Shenzhen, CN;
Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, CN;
Abstract
Disclosed is a local antistress test platform, comprising a test frame and a weight test rod for providing a local stress to a tested panel by adding weights. The local antistress test platform further comprises a movable test hole table for fixing the weight test rod; the movable test hole table is removably jointed to the test frame. The present invention also relates to local antistress test apparatus. The local antistress test platform and the test apparatus can easily locate the antistress test position and be adaptable to panel test for panels of different sizes.