The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2013

Filed:

Nov. 21, 2010
Applicants:

Laurent Fournier, Givat Ela, IL;

Anatoly Albert Koyfman, Kiriat Yam, IL;

Michal Rimon, Nofit, IL;

Inventors:

Laurent Fournier, Givat Ela, IL;

Anatoly Albert Koyfman, Kiriat Yam, IL;

Michal Rimon, Nofit, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A Design-Under-Test (DUT) may be designed to perform speculative execution of a branch path prior to determination whether the branch path is to be performed. Verification of the operation of DUT in respect to the speculative execution is disclosed. A template may be used to generate a plurality of tests. In addition to standard randomness of the tests to various parameters in accordance with the template, the tests may also differ in their respective speculative execution paths. The tests are partitioned by a generator into portions to be placed in speculative paths and portions to be placed in non-speculative paths. The generator may provide for a variance in portions. The generator may provide for nested speculative paths.


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