The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
Nov. 13, 2007
Han-cheol Kim, Yongin-si, KR;
Keun-soo Yim, Yongin-si, KR;
Seung-won Lee, Hwaseong-si, KR;
Jeong-joon Yoo, Yongin-si, KR;
Jae-don Lee, Paju-si, KR;
Young-sam Shin, Yongin-si, KR;
Han-cheol Kim, Yongin-si, KR;
Keun-soo Yim, Yongin-si, KR;
Seung-won Lee, Hwaseong-si, KR;
Jeong-joon Yoo, Yongin-si, KR;
Jae-don Lee, Paju-si, KR;
Young-sam Shin, Yongin-si, KR;
Samsung Electronics Co., Ltd., Suwon-Si, KR;
Abstract
A method and apparatus for detecting errors in an application software of an embedded system are provided. The method of detecting errors in an application software includes determining a development language of the application software and an operating system on which the application software is executed; replacing an error detection syntax inserted in order to examine an error in a predetermined function of the application software, with an error detection syntax according to the result of the determination; and performing exception handling for an error occurring in the function according to the result of the replacement, and logging error information according to the exception handling. According to the method and apparatus, an error can be automatically detected and logged irrespective of a development language and an operating system.