The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2013

Filed:

Aug. 12, 2011
Applicants:

Vijay Suman Pasupuleti, Pune, IN;

Tukaram Muske, Pune, IN;

Prasad Bokil, Pune, IN;

Ulka Shrotri, Pune, IN;

Venkatesh Ramanathan, Pune, IN;

Priyanka Darke, Pune, IN;

Inventors:

Vijay Suman Pasupuleti, Pune, IN;

Tukaram Muske, Pune, IN;

Prasad Bokil, Pune, IN;

Ulka Shrotri, Pune, IN;

Venkatesh Ramanathan, Pune, IN;

Priyanka Darke, Pune, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An automated system and method for test data generation for software testing. The present application relates to management of software testing by generating test data automatically. Further the system and method generate test data automatically with respect to two coverage criteria Boundary Value Coverage (BVC) and Masking Boundary Value Coverage (MBVC) in the white-box setting.


Find Patent Forward Citations

Pasupuleti, Vijay. (2013). System and method for automatic test data generation for relational testing (U.S. Patent No. 8589736). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8589736

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