The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2013

Filed:

Jun. 02, 2008
Applicants:

Trent Lorne Mcconaghy, Beatty, CA;

Charles Cazabon, Regina, CA;

Kristopher Breen, Saskatoon, CA;

Amit Gupta, Edmonton, CA;

Jeffrey Dyck, Saskatoon, CA;

Jiandong GE, Saskatoon, CA;

David Callele, Saskatoon, CA;

Shawn Rusaw, Saskatoon, CA;

Joel Cooper, Saskatoon, CA;

Anthony Arkles, Saskatoon, CA;

Samer Sallam, Saskatoon, CA;

Jason Coutu, Saskatoon, CA;

Inventors:

Trent Lorne McConaghy, Beatty, CA;

Charles Cazabon, Regina, CA;

Kristopher Breen, Saskatoon, CA;

Amit Gupta, Edmonton, CA;

Jeffrey Dyck, Saskatoon, CA;

Jiandong Ge, Saskatoon, CA;

David Callele, Saskatoon, CA;

Shawn Rusaw, Saskatoon, CA;

Joel Cooper, Saskatoon, CA;

Anthony Arkles, Saskatoon, CA;

Samer Sallam, Saskatoon, CA;

Jason Coutu, Saskatoon, CA;

Assignee:

Solido Design Automation Inc., Saskatoon, Saskatchewan, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method to analyze analog, mixed-signal, and custom digital circuits. The system and method displays to a user characteristic values of a circuit and statistical uncertainty values of the characteristic values early in a sampling or characterization run of the circuit. The characteristic values and their statistical uncertainties are updated as the sampling or characterization run progresses. The user can halt the sampling or characterization run once a desired level of uncertainty is attained. The system can automatically halt the sampling or characterization run, once the statistical uncertainty lie within a pre-determined range.


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