The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2013

Filed:

Apr. 14, 2008
Applicants:

Akihiro Uenishi, Tokyo, JP;

Takashi Ariga, Tokyo, JP;

Shigeru Yonemura, Tokyo, JP;

Jun Nitta, Tokyo, JP;

Tohru Yoshida, Tokyo, JP;

Inventors:

Akihiro Uenishi, Tokyo, JP;

Takashi Ariga, Tokyo, JP;

Shigeru Yonemura, Tokyo, JP;

Jun Nitta, Tokyo, JP;

Tohru Yoshida, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06G 7/48 (2006.01); G01L 1/00 (2006.01); G01L 3/00 (2006.01); G01L 5/00 (2006.01); G06F 19/00 (2011.01); G06F 7/66 (2006.01);
U.S. Cl.
CPC ...
Abstract

When discretizing an analysis target part into plural elements and performing analysis, sheet thickness reduction rate or maximum principal strain at an equivalent position including a same element is compared by either a manner of combining two adjacent elements after the analysis or a manner of changing an element discretization size with two types and performing the analysis, and the element where the difference is large is extracted as a fracture risk portion. With this structure, a fracture risk portion can be extracted reliably when a fracture is predicted by a finite element method.


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