The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2013

Filed:

Nov. 01, 2010
Applicants:

Kimito Idemori, Saitama, JP;

Takahiro Shirota, Fuchu, JP;

Hiroyuki Kobayashi, Matsudo, JP;

Katsuhiro Sumi, Hino, JP;

Tomohiko Tanimoto, Tama, JP;

Nobutaka Nishimura, Koganei, JP;

Inventors:

Kimito Idemori, Saitama, JP;

Takahiro Shirota, Fuchu, JP;

Hiroyuki Kobayashi, Matsudo, JP;

Katsuhiro Sumi, Hino, JP;

Tomohiko Tanimoto, Tama, JP;

Nobutaka Nishimura, Koganei, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 9/00 (2006.01); G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment, a conveyor diagnostic device diagnoses an abnormal state of a cyclically moving conveyor. The conveyor diagnostic device includes a first tilt sensor, a second tilt sensor, a table, and a processing unit. The first and second tilt sensors are attached to a predetermined position of the conveyor and detect tilt angles of the conveyor in a vertical direction and horizontal direction, respectively. The table indicates a relationship between a tilt angle which changes in the vertical direction and sections included in one revolution of the conveyor. The processing unit specifies an abnormality occurrence position of the conveyor based on a tilt angle in the vertical direction, the table, and an elapsed time after ingression for a section corresponding to the tilt angle in the vertical direction, when a tilt angle in the horizontal direction exceeds a predetermined management limit value.


Find Patent Forward Citations

Loading…