The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2013

Filed:

Mar. 04, 2013
Applicant:

Neilsen-kuljian, Inc., San Jose, CA (US);

Inventors:

Huy D. Nguyen, Tracy, CA (US);

Tom Lik-Chung Lee, San Jose, CA (US);

Assignee:

Neilsen-Kuljian, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for measuring RMS values of burst-fired currents includes a current sensor having a signal output, an analog-to-digital (A/D) converter coupled to the signal output of the current sensor, a digital processor coupled to an output of the A/D converter, and a digital memory coupled to the digital processor. Code segments stored in the digital memory are executable on the digital processor and implement a process of: a) initially sampling the output of the A/D converter; b) determining from the initial sampling a burst-fired current pattern; c) sampling the output of the A/D converter N times within a burst-fired current pattern to provide N samples; and d) calculating an RMS value from the N samples.


Find Patent Forward Citations

Nguyen, Huy. (2013). Method and apparatus for measuring rms values of burst-fired currents (U.S. Patent No. 8589101). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8589101

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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