The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
Jul. 22, 2009
Hugues Djikpesse, Cambridge, MA (US);
Mohamed-rabigh Khodja, Quincy, MA (US);
Michael David Prange, Somerville, MA (US);
Hugues Djikpesse, Cambridge, MA (US);
Mohamed-Rabigh Khodja, Quincy, MA (US);
Michael David Prange, Somerville, MA (US);
Schlumberger Technology Corporation, Sugar Land, TX (US);
Abstract
A Bayesian methodology is described for designing experiments or surveys that are improved by utilizing available prior information to guide the design toward maximally reducing posterior uncertainties in the interpretation of the future experiment. Synthetic geophysical tomography examples are used to illustrate benefits of this approach.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile