The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
Nov. 22, 2010
Su Wang, San Jose, CA (US);
Shengyang Dai, San Jose, CA (US);
Akira Nakamura, San Jose, CA (US);
Takeshi Ohashi, Kanagawa, JP;
Jun Yokono, Tokyo, JP;
Su Wang, San Jose, CA (US);
Shengyang Dai, San Jose, CA (US);
Akira Nakamura, San Jose, CA (US);
Takeshi Ohashi, Kanagawa, JP;
Jun Yokono, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
Systems and methods for implementing a superpixel boosted top-down image recognition framework are provided. The framework utilizes superpixels comprising contiguous pixel regions sharing similar characteristics. Feature extraction methods described herein provide non-redundant image feature vectors for classification model building. The provided framework differentiates a digitized image into a plurality of superpixels. The digitized image is characterized through image feature extraction methods based on the plurality of superpixels. Image classification models are generated from the extracted image features and ground truth labels and may then be used to classify other digitized images.