The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2013

Filed:

Dec. 28, 2010
Applicants:

Yoshitaro Nakano, Sunto-gun, JP;

Yousuke Takahama, Tokushima, JP;

Takeshi Nitta, Tokushima, JP;

Inventors:

Yoshitaro Nakano, Sunto-gun, JP;

Yousuke Takahama, Tokushima, JP;

Takeshi Nitta, Tokushima, JP;

Assignees:

Nikon Corporation, Tokyo, JP;

The University of Tokushima, Tokushima, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

Statistical data of a fluorescence population is obtained easily with high accuracy. To achieve this, an evaluation apparatus of fluorescence population of the present application includes an input unit inputting a fluorescence observation image (If) of a fluorescence population and a transillumination observation image (It) having a same field of view as the fluorescence observation image, a first detecting unit (Mt) detecting, as a first area, an area in which a cellular image exists on the transillumination observation image being input, a setting unit (If') setting, as a reference area, an area corresponding to the first area on the fluorescence observation image being input, and an obtaining unit obtaining fluorescence intensity data of a fluorescence image from the reference area in the fluorescence observation image.


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