The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
Feb. 04, 2010
Hsiang-wen Hsieh, Hsinchu County, TW;
Hung-hsiu Yu, Changhua County, TW;
Yu-kuen Tsai, Taipei County, TW;
Wei-han Wang, Taipei, TW;
Chin-chia Wu, Taipei, TW;
Hsiang-Wen Hsieh, Hsinchu County, TW;
Hung-Hsiu Yu, Changhua County, TW;
Yu-Kuen Tsai, Taipei County, TW;
Wei-Han Wang, Taipei, TW;
Chin-Chia Wu, Taipei, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A mapping method is provided. The environment is scanned to obtain depth information of environmental obstacles. The image of the environment is captured to generate an image plane. The depth information of environmental obstacles is projected onto the image plane, so as to obtain projection positions. At least one feature vector is calculated from a predetermined range around each projection position. The environmental obstacle depth information and the environmental feature vector are merged to generate a sub-map at a certain time point. Sub-maps at all time points are combined to generate a map. In addition, a localization method using the map is also provided.