The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
Feb. 21, 2007
Zheng Zi LI, Seongnam-Si, KR;
Yong Suk Hwang, Yongin-si, KR;
Jae Hyeong Kim, Seoul, KR;
Sang Bae Ji, Yongin-Si, KR;
Zheng Zi Li, Seongnam-Si, KR;
Yong Suk Hwang, Yongin-si, KR;
Jae Hyeong Kim, Seoul, KR;
Sang Bae Ji, Yongin-Si, KR;
Intellectual Discovery Co., Ltd., Seoul, KR;
Abstract
Provided are a decoding apparatus, a decoding method and a receiving apparatus for decoding in a system supporting an OFDM/OFDMA scheme. The decoding method includes the steps of: receiving phase-modulated signal; performing subcarrier demodulation on the received signal and generating correlation metrics; generating decoding metrics using the correlation metrics; and determining a payload using the largest metric of the decoding metrics and at least one of an average metric and the second largest metric of the decoding metrics. The decoding apparatus includes: a receiving buffer for buffering received phase-modulated signal; a likelihood metric generator for generating decoding metrics corresponding to likelihoods of the received signal buffered in the receiving buffer being determined as respective potential payload values; a mean calculator for calculating an average metric; and a payload determiner for determining a payload using the largest metric of the decoding metrics and at least one of an average metric and the second largest metric of the decoding metrics.