The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8587871 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 19, 2013

Filed:

Feb. 03, 2012
Applicant:

Yasunari Fukuta, Osaka, JP;

Inventor:

Yasunari Fukuta, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a wafer lens in which the warpage of a glass substrate included therein can be prevented. Specifically disclosed is a wafer lens comprising a glass substrate, a first resin part composed of a curable resin, and a second resin part composed of a curable resin. In each of the first resin part and the second resin part, two or more lens parts are formed. The volume of the resin of the first resin part after the cutting and the volume of the resin of the second resin part after the cutting satisfy the condition 0.6≦Vwa/Vwb≦2.1, wherein 'Vwa' indicates a volume of a resin on an object side and 'Vwb' indicates a volume of a resin on an image side.


Find Patent Forward Citations

Fukuta, Yasunari. (2013). Wafer lens and method for the production thereof (U.S. Patent No. 8587871). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8587871

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