The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
Nov. 03, 2005
Juergen Riedmann, Brezfeld, DE;
Ingo Boehm, Heidelberg, DE;
Volker Leimbach, Ludwigshafen, DE;
Heinrich Ulrich, Heidelberg, DE;
Holger Birk, Meckesheim, DE;
Juergen Riedmann, Brezfeld, DE;
Ingo Boehm, Heidelberg, DE;
Volker Leimbach, Ludwigshafen, DE;
Heinrich Ulrich, Heidelberg, DE;
Holger Birk, Meckesheim, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
A device for examining and manipulating microscopic objects with a microscope having a light source that serves to illuminate the object, and which generates an illumination light beam that runs along and illumination beam path, that can be guided over or through the object by means of a beam deflector, with a detector to detect light emitted from the object that runs along the detection beam path, with a primary beam splitter, and with a light source, which generates a manipulation light beam that runs along an illumination beam path, that serves to manipulate the object.