The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
Oct. 27, 2005
Anurag Gupta, Corvallis, OR (US);
Michael Long, Corvallis, OR (US);
Jeffrey M. Dicarlo, Menlo Park, CA (US);
Anurag Gupta, Corvallis, OR (US);
Michael Long, Corvallis, OR (US);
Jeffrey M. DiCarlo, Menlo Park, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
Imaging systems, imaging device analysis systems, imaging device analysis methods, and light beam emission methods are described. According to one aspect, an imaging device analysis method includes receiving initial light comprising a plurality of wavelengths of light, filtering some of the wavelengths of the initial light forming a plurality of light beams comprising different wavelengths of light, after the filtering, optically communicating the light beams of the different wavelengths of light to an imaging device, receiving the light beams using the imaging device, and analyzing the imaging device using light, wherein the light beams comprising the different wavelengths of light are emitted beams after the receiving.