The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
May. 04, 2012
Applicants:
Dirk Fey, Neewiller, FR;
Gunther Krieg, Karlsruhe, DE;
Inventors:
Dirk Fey, Neewiller, FR;
Gunther Krieg, Karlsruhe, DE;
Assignee:
Prof. Dr.-Ing. Gunther Krieg, Karlsruhe, DE;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); B41F 33/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention concerns a sample chamber used for monitoring the concentrations of components of additives in a printing process liquid for maintaining predetermined desired concentrations of components of additives in a printing process liquid, wherein the actual concentrations of components are determined followed by redosing of measured components to a predetermined desired concentration.
Fey, Dirk. (2013). Sample chamber for monitoring the concentration of components of additives in a printing process liquid (U.S. Patent No. 8587785). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8587785
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile