The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2013

Filed:

Sep. 07, 2011
Applicant:

Ingo Schiffler, Freiburg, DE;

Inventor:

Ingo Schiffler, Freiburg, DE;

Assignee:

Sick AG, Waldkirch, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to an optical analysis device for analyzing a medium in a measurement volume, comprising a housing having an opening, a flange for holding the housing in a reception opening of the measurement volume and an optical analysis unit in the housing. In accordance with the invention, a fastening stub provided at the housing and including the opening is provided for fastening the housing in the flange, with the fastening stub having an outer geometry which is matched to the inner geometry of the flange such that it can be displaced in the flange in the direction of the measurement volume and away from it. A clip is provided with which the flange and the fastening stub can be connected to one another in shape-matched and/or force-transmitting manner in different positions of the fastening stub in the flange.


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