The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
Dec. 01, 2009
Dan Lelescu, Morgan Hill, CA (US);
Chihsin Wu, San Jose, CA (US);
David R. Pope, Fremont, CA (US);
Cheng LU, Santa Clara, CA (US);
Dan Lelescu, Morgan Hill, CA (US);
Chihsin Wu, San Jose, CA (US);
David R. Pope, Fremont, CA (US);
Cheng Lu, Santa Clara, CA (US);
Aptina Imaging Corporation, Georgetown, Grand Cayman, unknown;
Abstract
Systems and methods are provided for focus recovery of multi-channel images. Control circuitry of an imaging system can restore an image by removing image blurring introduced by the lens, sensor noise introduced by the sensor, and a signal offset between multiple channels of the image. In some embodiments, the control circuitry can calculate one or more estimates of a signal offset of multiple observed signals. Using statistics generated from offset-removed signals, the control circuitry can generate one or more recovery kernels which can be applied to offset-removed signals to generate recovered signals. In other embodiments, instead of explicitly removing a signal offset from each observed signal, the control circuitry can implicitly remove the signal offset when calculating the first and second order statistics of one or more observed signals.